Nano‐Kirigami Structures and Branched Nanowires Fabricated by Focused Ion Beam‐Induced Milling, Bending, and Deposition (Adv. Mater. Interfaces 28/2022)
نویسندگان
چکیده
Nano-Kirigami Cutting of the Si3N4 membrane is performed with a Ne or He FIB. A broad dosage from Ga FIB then induces bending membrane. The beam optionally used grow vertical pillars before and after bending. All images created beam; center scale bar 200 nm. This reported by Deying Xia John Notte in article number 2200696.
منابع مشابه
Multifunctional carbon nanoelectrodes fabricated by focused ion beam milling.
We report a strategy for fabrication of sub-micron, multifunctional carbon electrodes and application of these electrodes as probes for scanning electrochemical microscopy (SECM) and scanning ion conductance microscopy (SICM). The fabrication process utilized chemical vapor deposition of parylene, followed by thermal pyrolysis to form conductive carbon and then further deposition of parylene to...
متن کاملPhotonic crystal structures with ultrahigh aspect ratio in lithium niobate fabricated by focused ion beam milling
Lithium niobate LiNbO3, LN is an important material which is widely applied in fabricating photonic and acoustic devices. However, it is difficult to either wet etch or dry etch LN due to the material’s properties. Here, the authors report novel pattern fabrication based on LN using focused ion beam FIB milling. When an array of small holes is etched, a severe tapering problem is observed as is...
متن کاملNanodispenser for attoliter volume deposition using atomic force microscopy probes modified by focused-ion-beam milling
In this letter, we describe the on-demand dispensing of single liquid droplets with volumes down to a few attoliters and submicrometric spacing. This dispensing is achieved using a standard atomic force microscope probe, with a 200 nm aperture at the tip apex, opened by focused ion beam milling. The inside of the tip is used as reservoir for the liquid. This maskless dispensing, realized in amb...
متن کاملTunable nano devices fabricated by controlled deposition of gold nanoparticles via focused ion beam
0167-9317/$ see front matter 2009 Elsevier B.V. A doi:10.1016/j.mee.2009.12.031 * Corresponding author. E-mail address: [email protected] (Z. Zalevsky) In this paper, we present the fabrication procedures as well as the preliminary experimental results of a novel method for significantly simplified deposition of charged nanoparticles at specific patterns based on focused ion beam (FIB) tech...
متن کاملEfficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling
Fresnel zone plates (FZPs) recently showed significant improvement by focusing soft X-rays down to ~10 nm. In contrast to soft X-rays, generally a very high aspect ratio FZP is needed for efficient focusing of hard X-rays. Therefore, FZPs had limited success in the hard X-ray range owing to difficulties of manufacturing high-aspect-ratio zone plates using conventional techniques. Here, employin...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Advanced Materials Interfaces
سال: 2022
ISSN: ['2196-7350']
DOI: https://doi.org/10.1002/admi.202270155